Schematic of the operando X-ray photoemission measurement that enable the probing of the in plane and out plane electric field.
Schematic of the operando X-ray photoemission measurement that enable the probing of the in plane and out plane electric field. © The authors
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Contact(s)
Debora Pierucci
Communication CNRS Physique
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INSP
IMPMC

Where’s the bias, then?

Résultat scientifique

Two-dimensional materials open up new possibilities in optoelectronics, notably through their ability to be freely assembled into heterostructures with diverse properties. This work highlights the importance of finely characterizing the electronic structure of such devices under real operating conditions, revealing - via X-ray imaging - a sometimes unexpected potential distribution in a WS₂/MoSe₂ heterostructure.

The present study was carried out in the following CNRS laboratories:

  • Institut des NanoSciences de Paris (INSP, CNRS/Sorbonne Université)
  • Institut de Minéralogie, de Physique des Matériaux et de Cosmochimie (IMPMC, CNRS/Museum National d'Histoire Naturelle/Sorbonne Université)

References :

Electric Field Distribution within a Van der Waals Heterostructure, Dario Mastrippolito, Mariarosa Cavallo, Erwan Bossavit, Clement Gureghian, Albin Colle, Tommaso Gemo, Giorgia Strobbia, Dries De Pesseroey, Marco Paye, Adrien Khalili, Huichen Zhang, Johan Biscaras, James K. Utterback, Pavel Dudin, José Avila, Emmanuel Lhuillier, Debora Pierucci, Nano Letters 25, 29, 11340–11346. Published: July 14, 2025.
DOI : 10.1021/acs.nanolett.5c02475
Open access : HAL

Contact

Debora Pierucci
Chercheuse CNRS à l'Institut des NanoSciences de Paris (INSP)
Communication CNRS Physique